Showing 1 - 3 results of 3 for search 'J. R. Lloyd', query time: 0.03s
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Stress relaxation in pulsed DC electromigration measurements by I. J. Ringler, J. R. Lloyd
Published 2016-09-01
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Reverse degradation of nickel graphene junction by hydrogen annealing by Zhenjun Zhang, Fan Yang, Pratik Agnihotri, Ji Ung Lee, J. R. Lloyd
Published 2016-02-01
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