Photoemission sources and beam blankers for ultrafast electron microscopy by Lixin Zhang, Jacob P. Hoogenboom, Ben Cook, Pieter Kruit

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Integrated Array Tomography for 3D Correlative Light and Electron Microscopy by Ryan Lane, Anouk H. G. Wolters, Ben N. G. Giepmans, Jacob P. Hoogenboom

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Correlative light and electron microscopy reveals fork-shaped structures at actin entry sites of focal adhesions by Karin Legerstee, Jason Sueters, Tsion E. Abraham, Johan A. Slotman, Gert-Jan Kremers, Jacob P. Hoogenboom, Adriaan B. Houtsmuller

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Electron-beam patterned calibration structures for structured illumination microscopy by Sangeetha Hari, Johan A. Slotman, Yoram Vos, Christian Floris, Wiggert A. van Cappellen, C. W. Hagen, Sjoerd Stallinga, Adriaan B. Houtsmuller, Jacob P. Hoogenboom

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Simultaneous correlative scanning electron and high-NA fluorescence microscopy. by Nalan Liv, A Christiaan Zonnevylle, Angela C Narvaez, Andries P J Effting, Philip W Voorneveld, Miriam S Lucas, James C Hardwick, Roger A Wepf, Pieter Kruit, Jacob P Hoogenboom

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A cryogenic, coincident fluorescence, electron, and ion beam microscope by Daan B Boltje, Jacob P Hoogenboom, Arjen J Jakobi, Grant J Jensen, Caspar TH Jonker, Max J Kaag, Abraham J Koster, Mart GF Last, Cecilia de Agrela Pinto, Jürgen M Plitzko, Stefan Raunser, Sebastian Tacke, Zhexin Wang, Ernest B van der Wee, Roger Wepf, Sander den Hoedt

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