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Author
James Baker-Jarvis
James Baker-Jarvis
James Roger Baker-Jarvis
(
né
Baker
; February 8, 1950 — December 31, 2011) was an American applied physicist and metrologist who was a research scientist at the Electromagnetics Division at
National Institute of Standards and Technology
(NIST). He is best known for his contribution to the
metrology
of
dielectric
properties of materials in
microwave
frequencies.
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Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations
by
James Baker-Jarvis
Published 2008-10-01
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