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James C. Gallagher
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Author
James C. Gallagher
Showing
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James C. Gallagher
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1
Detecting defects that reduce breakdown voltage using machine learning and optical profilometry
by
James C. Gallagher
,
Michael A. Mastro
,
Alan G. Jacobs
,
Robert. J. Kaplar
,
Karl D. Hobart
,
Travis J. Anderson
Published 2024-03-01
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Article
2
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniques
by
James C. Gallagher
,
Mona A. Ebrish
,
Matthew A. Porter
,
Alan G. Jacobs
,
Brendan P. Gunning
,
Robert J. Kaplar
,
Karl D. Hobart
,
Travis J. Anderson
Published 2022-01-01
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Article
3
Using machine learning with optical profilometry for GaN wafer screening
by
James C. Gallagher
,
Michael A. Mastro
,
Mona A. Ebrish
,
Alan G. Jacobs
,
Brendan P. Gunning
,
Robert J. Kaplar
,
Karl D. Hobart
,
Travis J. Anderson
Published 2023-02-01
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Article
4
Impact of Anode Thickness on Breakdown Mechanisms in Vertical GaN PiN Diodes with Planar Edge Termination
by
Mona A. Ebrish
,
Matthew A. Porter
,
Alan G. Jacobs
,
James C. Gallagher
,
Robert J. Kaplar
,
Brendan P. Gunning
,
Karl D. Hobart
,
Travis J. Anderson
Published 2022-04-01
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Article
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