Showing 1 - 16 results of 16 for search 'James E. Chung.', query time: 0.05s Refine Results
  1. 1
    SIMOX buried-oxide conduction mechanisms

    SIMOX buried-oxide conduction mechanisms by Krska, Jee-Hoon Yap

    Published 2005
    Other Authors: “…James E. Chung.…”
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    Thesis
  2. 2
    Semiconductor cluster tool availability

    Semiconductor cluster tool availability by Bailey, Troy A

    Published 2005
    Other Authors: “…James E. Chung.…”
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    Thesis
  3. 3
    Hot-carrier reliability of MOSFETs at room and cryogenic temperature

    Hot-carrier reliability of MOSFETs at room and cryogenic temperature by Kim, SeokWon Abraham, 1970-

    Published 2005
    Other Authors: “…James E. Chung.…”
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    Thesis
  4. 4
    Hot-carrier reliability evaluation for CMOS devices and circuits

    Hot-carrier reliability evaluation for CMOS devices and circuits by Chan, Vei-Han

    Published 2007
    Other Authors: “…James E. Chung.…”
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    Thesis
  5. 5
    Automated MOSFET parameter extraction

    Automated MOSFET parameter extraction by Lui, Jerome C. (Jerome Chun Lung)

    Published 2007
    Other Authors: “…James E. Chung.…”
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    Thesis
  6. 6
    Modeling for hot-electron reliability simulation

    Modeling for hot-electron reliability simulation by Kim, SeokWon Abraham, 1970-

    Published 2007
    Other Authors: “…James E. Chung.…”
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    Thesis
  7. 7
    Characterization of LOCOS and oxidized mesa isolation in deep-sub micrometer SOI NMOS processes

    Characterization of LOCOS and oxidized mesa isolation in deep-sub micrometer SOI NMOS processes by Thomas, Jeffrey Wade

    Published 2007
    Other Authors: “…James E. Chung.…”
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    Thesis
  8. 8
    Characterization of hot-carrier reliability in analog sub-circuit design

    Characterization of hot-carrier reliability in analog sub-circuit design by Le, Huy X. P

    Published 2008
    Other Authors: “…James E. Chung.…”
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    Thesis
  9. 9
    Hot-carrier reliability assessment in CMOS digital integrated circuits

    Hot-carrier reliability assessment in CMOS digital integrated circuits by Jiang, Wenjie, 1963-

    Published 2009
    Other Authors: “…James E. Chung.…”
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    Thesis
  10. 10
    A general methodology for assessing and characterizing variation in semiconductor manufacturing

    A general methodology for assessing and characterizing variation in semiconductor manufacturing by Stine, Brian E. (Brian Eugene), 1971-

    Published 2005
    Other Authors: “…Duane S. Bonging, James E. Chung.…”
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    Thesis
  11. 11
    The development of a nonvolatile ferroelectric memory with nondestructive readout

    The development of a nonvolatile ferroelectric memory with nondestructive readout by Chadwick, Thomas B. (Thomas Burhoe)

    Published 2005
    Other Authors: “…Anthony Marques and James E. Chung.…”
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    Thesis
  12. 12
    Modeling of chemical mechanical polishing for dielectric planarization

    Modeling of chemical mechanical polishing for dielectric planarization by Ouma, Dennis Okumu

    Published 2005
    Other Authors: “…Duane S. Boning and James E. Chung.…”
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    Thesis
  13. 13
    Extreme-submicrometer silicon-on-insulator (SOI) MOSFETs

    Extreme-submicrometer silicon-on-insulator (SOI) MOSFETs by Su, Lisa T. (Lisa Tzu-Feng)

    Published 2005
    Other Authors: “…Dimitri A. Antoniadis, James E. Chung.…”
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    Thesis
  14. 14
    Increased semiconductor fabrication capacity through cross-site processing

    Increased semiconductor fabrication capacity through cross-site processing by Cowger, Christopher L. (Christopher Leland), 1971-

    Published 2009
    Other Authors: “…Thomas L. Magnanti and James E. Chung.…”
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    Thesis
  15. 15
    Metrology of SIMOX buried oxide and nitride/STI CMP

    Metrology of SIMOX buried oxide and nitride/STI CMP by Yoon, Jung Uk, 1971-

    Published 2010
    Other Authors: “…James E. Chung and Carl V. Thompson.…”
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    Thesis
  16. 16
    On the methodology of assessing hot-carrier reliability of analog circuits

    On the methodology of assessing hot-carrier reliability of analog circuits by Le, Huy X. P

    Published 2014
    Other Authors: “…James E. Chung and Paul J. Marcoux.…”
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    Thesis

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