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Validating neural networks for spectroscopic classification on a universal synthetic dataset by Jan Schuetzke, Nathan J. Szymanski, Markus Reischl
Published 2023-06-01
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Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments by Jan Schuetzke, Simon Schweidler, Friedrich R. Muenke, Andre Orth, Anurag D. Khandelwal, Ben Breitung, Jasmin Aghassi‐Hagmann, Markus Reischl
Published 2024-03-01
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