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    The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process

    The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process por Choi Sung-Jin, Jang Moongyu, Park Youngsam, Jun Myungsim, Hyun Younghoon, Zyung Taehyoung

    Publicado 2010-01-01
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