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    Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT

    Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT by Martin Florovič, Jaroslav Kováč, Aleš Chvála, Jaroslav Kováč, Jean-Claude Jacquet, Sylvain Laurent Delage

    Published 2021-11-01
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