Stability of Wafer-Scale Thin Films of Vertically Aligned Hexagonal BN Nanosheets Exposed to High-Energy Ions and Reactive Atomic Oxygen by Shiyong Huang, Zhi Kai Ng, Hongling Li, Apoorva Chaturvedi, Jian Wei Mark Lim, Roland Yingjie Tay, Edwin Hang Tong Teo, Shuyan Xu, Kostya (Ken) Ostrikov, Siu Hon Tsang

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