Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers. by Sheng-Xing Wang, Yu-Lei Zhu, De-Xin Zhang, Hui Shao, Peng Liu, Jian-Bang Hu, Heng Zhang, Hai-Ping Zhang, Cheng Chang, Jie Lu, Xian-Chun Xia, Gen-Lou Sun, Chuan-Xi Ma

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