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    The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation

    The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation by Ismail, Mohd Khairuddin, Lim, Shi Xuen, Mohd Azraai, Mohd Razman, Jessnor Arif, Mat Jizat, Yuen, Edmund, Jiang, Haochuan, Yap, Eng Hwa, Anwar, P. P. Abdul Majeed

    Published 2023
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    Conference or Workshop Item

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