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Simulation-Based Analysis of the Effect of Alpha Irradiation on GaN Particle Detectors by Jianming Lei, Nan Wang, Rukai Jiang, Qianyu Hou
Published 2023-09-01
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An Analytical Model of Dynamic Power Losses in eGaN HEMT Power Devices by Jianming Lei, Yangyi Liu, Zhanmin Yang, Yalin Chen, Dunjun Chen, Liang Xu, Jing Yu
Published 2023-08-01
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Evaluation on Temperature-Dependent Transient <i>V</i><sub>T</sub> Instability in p-GaN Gate HEMTs under Negative Gate Stress by Fast Sweeping Characterization by Rui Wang, Hui Guo, Qianyu Hou, Jianming Lei, Jin Wang, Junjun Xue, Bin Liu, Dunjun Chen, Hai Lu, Rong Zhang, Youdou Zheng
Published 2022-07-01
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