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Prediction Model for Random Variation in FinFET Induced by Line-Edge-Roughness (LER) by Jinwoong Lee, Taeeon Park, Hongjoon Ahn, Jihwan Kwak, Taesup Moon, Changhwan Shin
Published 2021-02-01
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GAN-Based Framework for Unified Estimation of Process-Induced Random Variation in FinFET by Taeeon Park, Jihwan Kwak, Hongjoon Ahn, Jinwoong Lee, Jaehyuk Lim, Sangho Yu, Changhwan Shin, Taesup Moon
Published 2022-01-01
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