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    Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

    Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale 由 Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire, Serene Pauly, Andrew Rogers, TJ Lindsay, Kristina M. Holsgrove, Brian J. Rodriguez, Navneet Soin, John Marty Gregg, Raymond G. P. McQuaid, Amit Kumar

    出版 2024-07-01
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