Showing 1 - 2 results of 2 for search 'Jon H. Eggert', query time: 0.04s
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Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers by Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Sungwook Choi, Matthieu Chollet, Philip K. Cook, Eric Folsom, Eric Galtier, Arnulfo Gonzalez, Tais Gorkhover, Serge Guillet, Kristoffer Haldrup, Marylesa Howard, Kento Katagiri, Seonghan Kim, Sunam Kim, Sungwon Kim, Hyunjung Kim, Erik Bergbäck Knudsen, Stephan Kuschel, Hae Ja Lee, Chuanlong Lin, R. Stewart McWilliams, Bob Nagler, Martin Meedom Nielsen, Norimasa Ozaki, Dayeeta Pal, Ricardo Pablo Pedro, Alison M. Saunders, Frank Schoofs, Toshimori Sekine, Hugh Simons, Tim van Driel, Bihan Wang, Wenge Yang, Can Yildirim, Henning Friis Poulsen, Jon H. Eggert
Published 2023-10-01
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A MHz X-ray diffraction set-up for dynamic compression experiments in the diamond anvil cell by Rachel J. Husband, Cornelius Strohm, Karen Appel, Orianna B. Ball, Richard Briggs, Johannes Buchen, Valerio Cerantola, Stella Chariton, Amy L. Coleman, Hyunchae Cynn, Dana Dattelbaum, Anand Dwivedi, Jon H. Eggert, Lars Ehm, William J. Evans, Konstantin Glazyrin, Alexander F. Goncharov, Heinz Graafsma, Alex Howard, Larissa Huston, Trevor M. Hutchinson, Huijeong Hwang, Sony Jacob, Johannes Kaa, Jaeyong Kim, Minseob Kim, Egor Koemets, Zuzana Konôpková, Falko Langenhorst, Torsten Laurus, Xinyang Li, Jona Mainberger, Hauke Marquardt, Emma E. McBride, Christopher McGuire, James D. McHardy, Malcolm I. McMahon, R. Stewart McWilliams, Alba S. J. Méndez, Anshuman Mondal, Guillaume Morard, Earl F. O'Bannon, Christoph Otzen, Charles M. Pépin, Vitali B. Prakapenka, Clemens Prescher, Thomas R. Preston, Ronald Redmer, Michael Roeper, Carmen Sanchez-Valle, Dean Smith, Raymond F. Smith, Daniel Sneed, Sergio Speziale, Tobias Spitzbart, Stephan Stern, Blake T. Sturtevant, Jolanta Sztuk-Dambietz, Peter Talkovski, Nenad Velisavljevic, Cara Vennari, Zhongyan Wu, Choong-Shik Yoo, Ulf Zastrau, Zsolt Jenei, Hanns-Peter Liermann
Published 2023-07-01
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