Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects by Minji Bang, Jonghyeon Ha, Gyeongyeop Lee, Minki Suh, Jungsik Kim

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On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET by Jonghyeon Ha, Gyeongyeop Lee, Hagyoul Bae, Kihyun Kim, Jin-Woo Han, Jungsik Kim

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Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory by Jonghyeon Ha, Minji Bang, Gyeongyeop Lee, Minki Suh, Chong-Eun Kim, Jungsik Kim

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Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors by Gyeongyeop Lee, Jonghyeon Ha, Kihyun Kim, Hagyoul Bae, Chong-Eun Kim, Jungsik Kim

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Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAM by Minki Suh, Minsang Ryu, Jonghyeon Ha, Minji Bang, Dabok Lee, Hojoon Lee, Hyunchul Sagong, Jungsik Kim

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Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models by Jonghyeon Ha, Sun Jin Kim, Minji Bang, Gyeongyeop Lee, Minki Suh, Minseob Shim, Chong-Eun Kim, Jungsik Kim

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Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell by Minji Bang, Jonghyeon Ha, Minki Suh, Dabok Lee, Minsang Ryu, Jin-Woo Han, Hyunchul Sagong, Hojoon Lee, Jungsik Kim

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