Electromigration failure and reliability of single-crystal and polycyrstalline aluminum interconnects for integrated circuits by Joo, Young-Chang

Get full text

Inverse association with COVID-19 vaccination status of the incidence of pneumonia after SARS-CoV-2 infection: A nationwide retrospective cohort study by Jihun Song, Seogsong Jeong, Seulggie Choi, Yun Hwan Oh, Sun Jae Park, Joo young Chang, Yoosun Cho, Kyeonghyang Byeon, Jun Yong Choi, Seju Lee, Jaehun Jung, Sang Min Park

Get full text

Microstructural Evolution in Thin Films of Electronic Materials by Thompson, Carl V., Longworth, Hai P., Kahn, Harold, Walton, Derek T., Frost, Harold J., Joo, Young-Chang, Knowlton, Brett D., Floro, Jerrold A., Carel, Roland, Bristowe, Paul D., Inglefield, Heather E., Bogomolov, Sergei, Ballentine, Craig, O'Handley, Robert C., Ma, En, Miura, Hideo, Uda, Takauki, Della Ratta, Anthony D., Ro, Jaesang, Dubner, Andrew D., Wagner, A., Melngailis, John

Get full text

Long-term reliable physical health monitoring by sweat pore–inspired perforated electronic skins by Yeon, Hanwool, Lee, Haneol, Kim, Yeongin, Lee, Doyoon, Lee, Youngjoo, Lee, Jong-Sung, Shin, Jiho, Choi, Chanyeol, Kang, Ji-Hoon, Suh, Jun Min, Kim, Hyunseok, Kum, Hyun S, Lee, Jaeyong, Kim, Daeyeon, Ko, Kyul, Ma, Boo Soo, Lin, Peng, Han, Sangwook, Kim, Sungkyu, Bae, Sang-Hoon, Kim, Taek-Soo, Park, Min-Chul, Joo, Young-Chang, Kim, Eunjoo, Han, Jiyeon, Kim, Jeehwan

Get full text