High-resolution detection of quantitative trait loci for seven important yield-related traits in wheat (Triticum aestivum L.) using a high-density SLAF-seq genetic map by Tao Li, Qiao Li, Jinhui Wang, Zhao Yang, Yanyan Tang, Yan Su, Juanyu Zhang, Xvebing Qiu, Xi Pu, Zhifen Pan, Haili Zhang, Junjun Liang, Zehou Liu, Jun Li, Wuyun Yan, Maoqun Yu, Hai Long, Yuming Wei, Guangbing Deng

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