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    Toward Ideal Low‐Frequency Noise in Monolayer CVD MoS2 FETs: Influence of van der Waals Junctions and Sulfur Vacancy Management

    Toward Ideal Low‐Frequency Noise in Monolayer CVD MoS2 FETs: Influence of van der Waals Junctions and Sulfur Vacancy Management by Wonjun Shin, Junsung Byeon, Ryun‐Han Koo, Jungmoon Lim, Jung Hyeon Kang, A‐Rang Jang, Jong‐Ho Lee, Jae‐Joon Kim, SeungNam Cha, Sangyeon Pak, Sung‐Tae Lee

    Published 2024-07-01
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