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  1. 1
    Comparison of Temperature Dependent Carrier Transport in FinFET and Gate-All-Around Nanowire FET

    Comparison of Temperature Dependent Carrier Transport in FinFET and Gate-All-Around Nanowire FET by Soohyun Kim, Jungchun Kim, Doyoung Jang, Romain Ritzenthaler, Bertrand Parvais, Jerome Mitard, Hans Mertens, Thomas Chiarella, Naoto Horiguchi, Jae Woo Lee

    Published 2020-04-01
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    Article
  2. 2
    Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm

    Automatic Prediction of Metal–Oxide–Semiconductor Field‐Effect Transistor Threshold Voltage Using Machine Learning Algorithm by Seoyeon Choi, Dong Geun Park, Min Jung Kim, Seain Bang, Jungchun Kim, Seunghee Jin, Ki Seok Huh, Donghyun Kim, Jerome Mitard, Cheol E. Han, Jae Woo Lee

    Published 2023-01-01
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    Article

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