Transient pulse analysis of ionized electronics exposed to γ-radiation generated from a relativistic electron beam by Sun-Hong Min, Ohjoon Kwon, Matlabjon Sattorov, In-Keun Baek, Seontae Kim, Dongpyo Hong, Jin-Young Jeong, Jungmin Jang, Anirban Bera, Ranjan Kumar Barik, Ranajoy Bhattacharya, Ilsung Cho, Byungsu Kim, Chawon Park, Wongyun Jung, Seunghyuk Park, Gun-Sik Park

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