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Ion-induced roughening and ripple formation on polycrystalline metallic films by T Škereň, K Temst, W Vandervorst, A Vantomme
Published 2013-01-01
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2
Direct observation of frozen moments in the NiFe/FeMn exchange bias system by J Mohanty, A Persson, D Arvanitis, K Temst, C Van Haesendonck
Published 2013-01-01
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3
Towards fully electrically controlled domain-wall logic by B. B. Vermeulen, E. Raymenants, V. T. Pham, S. Pizzini, B. Sorée, K. Wostyn, S. Couet, V. D. Nguyen, K. Temst
Published 2024-02-01
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