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Assessment of mixed-layer height estimation from single-wavelength ceilometer profiles by T. N. Knepp, T. N. Knepp, J. J. Szykman, J. J. Szykman, R. Long, R. M. Duvall, J. Krug, M. Beaver, K. Cavender, K. Kronmiller, M. Wheeler, R. Delgado, R. Hoff, T. Berkoff, E. Olson, R. Clark, D. Wolfe, D. Van Gilst, D. Neil
Published 2017-10-01
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