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METHODOLOGY FOR DETERMINING OPTIMAL EXPOSURE PARAMETERS OF A HYPERSPECTRAL SCANNING SENSOR by P. Walczykowski, K. Siok, A. Jenerowicz
Published 2016-06-01
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DETERMINING SPECTRAL REFLECTANCE COEFFICIENTS FROM HYPERSPECTRAL IMAGES OBTAINED FROM LOW ALTITUDES by P. Walczykowski, A. Jenerowicz, A. Orych, K. Siok
Published 2016-06-01
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