Showing 1 - 11 results of 11 for search 'Kai-Cheng Shie', query time: 0.04s
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A kinetic model of copper-to-copper direct bonding under thermal compression by Kai-Cheng Shie, A.M. Gusak, K.N. Tu, Chih Chen
Published 2021-11-01
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Effect of Bonding Strength on Electromigration Failure in Cu–Cu Bumps by Kai-Cheng Shie, Po-Ning Hsu, Yu-Jin Li, K. N. Tu, Chih Chen
Published 2021-10-01
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Failures of Cu-Cu Joints under Temperature Cycling Tests by Po-Ning Hsu, Kai-Cheng Shie, Dinh-Phuc Tran, Nien-Ti Tsou, Chih Chen
Published 2022-07-01
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Failure Mechanisms of Cu–Cu Bumps under Thermal Cycling by Kai-Cheng Shie, Po-Ning Hsu, Yu-Jin Li, Dinh-Phuc Tran, Chih Chen
Published 2021-09-01
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Low-Temperature Cu/SiO<sub>2</sub> Hybrid Bonding with Low Contact Resistance Using (111)-Oriented Cu Surfaces by Jia-Juen Ong, Wei-Lan Chiu, Ou-Hsiang Lee, Chia-Wen Chiang, Hsiang-Hung Chang, Chin-Hung Wang, Kai-Cheng Shie, Shih-Chi Yang, Dinh-Phuc Tran, King-Ning Tu, Chih Chen
Published 2022-03-01
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Artificial intelligence deep learning for 3D IC reliability prediction by Po-Ning Hsu, Kai-Cheng Shie, Kuan-Peng Chen, Jing-Chen Tu, Cheng-Che Wu, Nien-Ti Tsou, Yu-Chieh Lo, Nan-Yow Chen, Yong-Fen Hsieh, Mia Wu, Chih Chen, King-Ning Tu
Published 2022-04-01
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