TiN-Mediated Multi-Level Negative Photoconductance of the ZrO2 Breakdown Path by Zhou, Yu, Kawashima, Tomohito, Ang, Diing Shenp

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Optical reset modulation in the SiO 2 /Cu conductive-bridge resistive memory stack by Kawashima, Tomohito, Zhou, Yu, Yew, Kwang Sing, Ang, Diing Shenp

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White-light-induced annihilation of percolation paths in SIO2 and high-k dielectrics - prospect for gate oxide reliability rejuvenation and optical-enabled functions in CMOS integr... by Ang, Diing Shenp, Kawashima, Tomohito, Zhou, Yu, Yew, Kwang Sing, Bera, Milan Kumar, Zhang, Haizhong

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Restoration of postbreakdown gate oxide by white-light illumination by Kawashima, Tomohito, Yew, Kwang Sing, Zhou, Yu, Ang, Diing Shenp, Bera, Milan Kumar, Zhang, Haizhong

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White-light-induced disruption of nanoscale conducting filament in hafnia by Zhang, H. Z., Bersuker, G., Zhou, Y., Yew, Kwang Sing, Ang, Diing Shenp, Kawashima, Tomohito, Bera, Milan Kumar

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