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A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution by Zastrau, U, Feigl, T, Appel, K, Chen, B, Fletcher, LB, Förster, E, Gamboa, E, Gericke, DO, Göde, S, Grote-Fortmann, C, Hilbert, V, Kazak, L, Laarmann, T, Lee, HJ, Mabey, P, Martinez, F, Meiwes-Broer, KH, Pauer, H, Perske, M, Przystaw, A, Roling, S, Skruszewicz, S, Shihab, M, Tiggesbäumker, J, Toleikis, S, Wünsche, M, Zacharias, H, Glenzer, SH, Gregori, G
Published 2018Journal article