Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis by Korsunsky, A, Salvati, E, Lunt, A, Sui, T, Mughal, M, Daniel, R, Keckes, J, Bemporad, E, Sebastiani, M

Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling by Meindlhumer, M, Brandt, LR, Zalesak, J, Rosenthal, M, Hruby, H, Kopecek, J, Salvati, E, Mitterer, C, Daniel, R, Todt, J, Keckes, J, Korsunsky, AM