EVALUATION OF FOUR PROMISING BREAD WHEAT GENOTYPES TO DIFFERENT PHOSPHORUS LEVELS FOR YIELD AND ITS COMPONENTS حسب Mohammed Al-Falahy, Khalid Dawood, Dilsher Al Mahmada, Shleer Ahmad

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Evidence of ultra-low-k dielectric material degradation and nanostructure alteration of the Cu/ultra-low-k interconnects in time-dependent dielectric breakdown failure حسب Lam, Jeffrey C. K., Huang, Maggie Y. M., Ng, Tsu Hau, Mohammed Khalid Dawood, Zhang, Fan, Du, Anyan, Sun, Handong, Shen, Zexiang, Mai, Zhihong

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