Showing 1 - 2 results of 2 for search 'Kim, SeokWon Abraham, 1970-', query time: 0.02s
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Hot-carrier reliability of MOSFETs at room and cryogenic temperature by Kim, SeokWon Abraham, 1970-
Published 2005
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2
Modeling for hot-electron reliability simulation by Kim, SeokWon Abraham, 1970-
Published 2007
Thesis