Indirect Super Resolved Microscopy in the TEM. by Kirkland, A

Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data by Kirkland, A, Haigh, S

Aberration-Corrected Imaging in CTEM by Haigh, S, Kirkland, A

Finding phase information in the darkness by Haigh, S, Kirkland, A

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction. by Kirkland, A, Meyer, R

Measurement of off-axial aberration by Sawada, H, Kirkland, A

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction by Kirkland, A, Meyer, R

In‐Situ annealing of the (110) and (001) surfaces of SrTiO3 nanocuboids by high‐resolution transmission electron microscopy by Liberti, E, Kirkland, A

Applications of the Oxford-JEOL aberration-corrected electron microscope by Nellist, P, Kirkland, A

Direct and indirect electron microscopy of encapsulated nanocrystals by Kirkland, A, Sloan, J

Combining theory and experiment in determining the surface chemistry of nanocrystals by Barnard, A, Kirkland, A

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction by Kirkland, A, Meyer, R

Imaging electron detectors for low-voltage TEM by Moldovan, G, Kirkland, A

Editorial by Kirkland, A, Midgley, P

Measuring isoplanaticity in high-resolution electron microscopy by Meyer, R, Kirkland, A

High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition by Borisenko, K, Kirkland, A

Comparisons of linear and nonlinear image restoration. by Chang, L, Kirkland, A

Editorial. by Kirkland, A, Midgley, P

Aberration corrected TEM: current status and future prospects by Kirkland, A, Haigh, S, Chang, L

Ultrahigh resolution imaging of local structural distortions in intergrowth tungsten bronzes. by Kirkland, A, Sloan, J, Haigh, S