A 3D map of atoms in 2D materials af Kirkland, AI

Cryo-electron ptychography: applications and potential in biological characterisation af Huang, C, Kim, JS, Kirkland, AI

Applications of deep learning in electron microscopy af Treder, KP, Huang, C, Kim, JS, Kirkland, AI

Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization af MacLaren, I, Macgregor, TA, Allen, CS, Kirkland, AI

A new approach for 3D quantitative STEM using defocus corrected electron ptychography af Mostaed, A, Liberti, E, Huang, C, Kirkland, AI, Nellist, P

Super-resolution electron ptychography of low dimensional materials at 30 keV: beyond the detector limit af Allen, CS, Danaie, M, Warner, JH, Batey, DJ, Kirkland, AI

Exploring low-dose and fast electron ptychography using l0 regularisation of extended ptychographical iterative engine af Moshtaghpour, A, Velazco-Torrejon, A, Robinson, AW, Kirkland, AI, Browning, ND

Trainable segmentation for transmission electron microscope images of inorganic nanoparticles af Bell, CG, Treder, KP, Kim, JS, Schuster, ME, Kirkland, AI, Slater, TJA

Influence of precession electron diffraction parameters and energy filtering on reduced density function analysis of thin amorphous silica films—implications for structural studies... af Chou, Y-J, Borisenko, KB, Das, PP, Nicolopoulos, S, Gemmi, M, Kirkland, AI

Direct visualisation of the surface atomic active sites of carbon-supported Co3O4 nanocrystals via high-resolution phase restoration af Makgae, OA, Moya, AN, Phaahlamohlaka, TN, Huang, C, Coville, NJ, Kirkland, AI, Liberti, E

Confessions of a ptychopath: detection, dimensions, damage and despair af O'Leary, CM, Chang, DJ, Ercius, P, Nellist, PD, Kirkland, AI, Miao, J

Quantifying oxygen distortions in lithium-rich transition-metal-oxide cathodes using ABF STEM af Liberti, E, Lozano, JG, Pérez Osorio, MA, Roberts, MR, Bruce, PG, Kirkland, AI

Contrast transfer and noise considerations in focused-probe electron ptychography af O'Leary, CM, Martinez, GT, Liberti, E, Humphry, MJ, Kirkland, AI, Nellist, PD

Contrast transfer and noise minimization in electron ptychography af O'Leary, CM, Martinez, GT, Liberti, E, Humphry, MJ, Kirkland, AI, Nellist, PD

Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures af Nord, M, Barthel, J, Allen, CS, McGrouther, D, Kirkland, AI, MacLaren, I

Fast STEM simulation technique to improve quality of inpainted experimental images through dictionary transfer af Robinson, AW, Nicholls, D, Wells, J, Moshtaghpour, A, Chi, M, Kirkland, AI, Browning, ND

Quantitative electron ptychography for simultaneous light and heavy elements atom counting af Liberti, E, Moya, AN, Treder, KP, O'Leary, CM, Kim, JS, Nellist, PD, Kirkland, AI

Towards real-time STEM simulations through targeted subsampling strategies af Robinson, AW, Wells, J, Nicholls, D, Moshtaghpour, A, Chi, M, Kirkland, AI, Browning, ND

Simultaneous identification of low and high atomic number atoms in monolayer 2D materials using 4D scanning transmission electron microscopy af Wen, Y, Ophus, C, Allen, CS, Fang, S, Chen, J, Kaxiras, E, Kirkland, AI, Warner, JH

Phase reconstruction using fast binary 4D STEM data af O'Leary, CM, Allen, CS, Huang, C, Kim, JS, Liberti, E, Nellist, PD, Kirkland, AI