Channel Defect Profiling and Passivation for ZnO Thin-Film Transistors by Soo Cheol Kang, So Young Kim, Sang Kyung Lee, Kiyung Kim, Billal Allouche, Hyeon Jun Hwang, Byoung Hun Lee

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Demonstration of p-type stack-channel ternary logic device using scalable DNTT patterning process by Yongsu Lee, Heejin Kwon, Seung-Mo Kim, Ho-In Lee, Kiyung Kim, Hae-Won Lee, So-Young Kim, Hyeon Jun Hwang, Byoung Hun Lee

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Dual-channel P-type ternary DNTT–graphene barristor by Yongsu Lee, Seung-Mo Kim, Kiyung Kim, So-Young Kim, Ho-In Lee, Heejin Kwon, Hae-Won Lee, Chaeeun Kim, Surajit Some, Hyeon Jun Hwang, Byoung Hun Lee

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