Showing 1 - 2 results of 2 for search 'Klapetek Petr', query time: 0.02s Refine Results
  1. 1
    Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

    Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / by Klapetek, Petr

    Published 2013
  2. 2
    Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking

    Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking by Cara Eleonora, Hönicke Philipp, Kayser Yves, Beckhoff Burkhard, Giovannozzi Andrea M., Klapetek Petr, Zoccante Alberto, Cossi Maurizio, Tay Li-Lin, Boarino Luca, Ferrarese Lupi Federico

    Published 2024-08-01
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