Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique by Stadler Adam Witold, Kolek Andrzej, Zawiślak Zbigniew, Dziedzic Andrzej

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Measurements of Low Frequency Noise of Infrared Photo-Detectors with Transimpedance Detection System by Ciura Łukasz, Kolek Andrzej, Gawron Waldemar, Kowalewski Andrzej, Stanaszek Dariusz

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Noise Properties of Graphene-Polymer Thick-Film Resistors by Mleczko Krzysztof, Ptak Piotr, Zawiślak Zbigniew, Słoma Marcin, Jakubowska Małgorzata, Kolek Andrzej

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Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors by Stadler Adam Witold, Kolek Andrzej, Mleczko Krzysztof, Zawiślak Zbigniew, Dziedzic Andrzej, Nowak Damian

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