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1
AN ELECTRON-BEAM-INDUCED CURRENT STUDY OF DISLOCATIONS IN GAAS per Galloway, S, Wilshaw, P, Konkol, A
Publicat 1994Conference item -
2
BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE per Wilshaw, P, Konkol, A, Booker, G
Publicat 1991Journal article -
3
BACKSCATTERED ELECTRON CONTRAST ON CROSS-SECTIONS OF INTERFACES AND MULTILAYERS IN THE SCANNING ELECTRON-MICROSCOPE per Konkol, A, Booker, G, Wilshaw, P
Publicat 1995Journal article -
4
BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE per Wilshaw, P, Konkol, A, Booker, G
Publicat 1991Conference item -
5
Electron-beam-induced current study of dislocations in GaAs per Galloway, SA, Wilshaw, P, Konkol, A
Publicat 1994Journal article -
6
DECONVOLUTION METHOD TO OBTAIN COMPOSITION PROFILES FROM SEM BACKSCATTERED ELECTRON SIGNAL PROFILES FOR BULK SPECIMENS per Konkol, A, Wilshaw, P, Booker, G
Publicat 1994Journal article