1 - 6 toradh á dtaispeáint as 6 toradh san iomlán ar an gcuardach 'Konkol, A', am iarratais: 0.02s Beachtaigh na torthaí
  1. 1
    AN ELECTRON-BEAM-INDUCED CURRENT STUDY OF DISLOCATIONS IN GAAS

    AN ELECTRON-BEAM-INDUCED CURRENT STUDY OF DISLOCATIONS IN GAAS de réir Galloway, S, Wilshaw, P, Konkol, A

    Foilsithe / Cruthaithe 1994
    Conference item
  2. 2
    BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE

    BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE de réir Wilshaw, P, Konkol, A, Booker, G

    Foilsithe / Cruthaithe 1991
    Journal article
  3. 3
    BACKSCATTERED ELECTRON CONTRAST ON CROSS-SECTIONS OF INTERFACES AND MULTILAYERS IN THE SCANNING ELECTRON-MICROSCOPE

    BACKSCATTERED ELECTRON CONTRAST ON CROSS-SECTIONS OF INTERFACES AND MULTILAYERS IN THE SCANNING ELECTRON-MICROSCOPE de réir Konkol, A, Booker, G, Wilshaw, P

    Foilsithe / Cruthaithe 1995
    Journal article
  4. 4
    BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE

    BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE de réir Wilshaw, P, Konkol, A, Booker, G

    Foilsithe / Cruthaithe 1991
    Conference item
  5. 5
    Electron-beam-induced current study of dislocations in GaAs

    Electron-beam-induced current study of dislocations in GaAs de réir Galloway, SA, Wilshaw, P, Konkol, A

    Foilsithe / Cruthaithe 1994
    Journal article
  6. 6
    DECONVOLUTION METHOD TO OBTAIN COMPOSITION PROFILES FROM SEM BACKSCATTERED ELECTRON SIGNAL PROFILES FOR BULK SPECIMENS

    DECONVOLUTION METHOD TO OBTAIN COMPOSITION PROFILES FROM SEM BACKSCATTERED ELECTRON SIGNAL PROFILES FOR BULK SPECIMENS de réir Konkol, A, Wilshaw, P, Booker, G

    Foilsithe / Cruthaithe 1994
    Journal article

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