AN ELECTRON-BEAM-INDUCED CURRENT STUDY OF DISLOCATIONS IN GAAS door Galloway, S, Wilshaw, P, Konkol, A

BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE door Wilshaw, P, Konkol, A, Booker, G

BACKSCATTERED ELECTRON CONTRAST ON CROSS-SECTIONS OF INTERFACES AND MULTILAYERS IN THE SCANNING ELECTRON-MICROSCOPE door Konkol, A, Booker, G, Wilshaw, P

BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE door Wilshaw, P, Konkol, A, Booker, G

Electron-beam-induced current study of dislocations in GaAs door Galloway, SA, Wilshaw, P, Konkol, A

DECONVOLUTION METHOD TO OBTAIN COMPOSITION PROFILES FROM SEM BACKSCATTERED ELECTRON SIGNAL PROFILES FOR BULK SPECIMENS door Konkol, A, Wilshaw, P, Booker, G