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  1. 1
    Novel electrical characteristic measurement system of semiconductor films for estimating device characteristics

    Novel electrical characteristic measurement system of semiconductor films for estimating device characteristics por Kook Chul Moon, Hwarim Im, Gyohyeok Yun, Hyoungsik Kim, JungUn Na, Changhwan Kim, Yong-Sang Kim

    Publicado em 2024-10-01
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  2. 2
    Double-gate metal–oxide TFT pixel circuit for improved luminance uniformity of mobile OLED display

    Double-gate metal–oxide TFT pixel circuit for improved luminance uniformity of mobile OLED display por YiKyoung You, Kook Chul Moon, HyeongMin Kim, JungSuk Oh, SangWoon Lee, Jun Hyung Lim, Kyoung Seok Son, JaeHyung Cho, KeeChan Park

    Publicado em 2024-11-01
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