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    Thickness-dependent optimization of Er<sup>3+ </sup>light emission from silicon-rich silicon oxide thin films

    Thickness-dependent optimization of Er<sup>3+ </sup>light emission from silicon-rich silicon oxide thin films nork Jambois Olivier, Garrido Blas, Cueff S&#233;bastien, Labb&#233; Christophe, Portier Xavier, Rizk Richard

    Argitaratua 2011-01-01
    Testu osoa
    Artikulua

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