Showing 1 - 3 results of 3 for search 'Lai Chiu-Chung', query time: 0.04s Refine Results
  1. 1
    Analysis of Anti-JFET for 600V VDMOS and HCI Reliability

    Analysis of Anti-JFET for 600V VDMOS and HCI Reliability by Yang Shao-Ming, Sheu Gene, Lai Chiu-Chung, Deivasigamani Ravi

    Published 2018-01-01
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    Article
  2. 2
    Study of HCI Reliability for PLDMOS

    Study of HCI Reliability for PLDMOS by Deivasigamani Ravi, Sheu Gene, Aanand, Wei Lu Shao, Sarwar Imam Syed, Lai Chiu-Chung, Yang Shao-Ming

    Published 2018-01-01
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  3. 3
    An Innovated 80V-100V High-Side Side-Isolated N-LDMOS Device

    An Innovated 80V-100V High-Side Side-Isolated N-LDMOS Device by Yangi Shao Ming, Sheu Gene, Chien Ting Yao, Wu Chieh Chih, Lee Tzu Chieh, Wu Ching Yuan, Lai Chiu Chung

    Published 2018-01-01
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