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    Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF

    Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF by Fabio Lopes, Luís Henrique Cardozo Amorin, Larissa da Silva Martins, Alexandre Urbano, Carlos Roberto Appoloni, Roberto Cesareo

    Published 2016-01-01
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