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Electrical characterization of nano-MOSFETs in SOI technology by John P. Artieda, Lionel Trojman, Felice Crupi, Lars-Åke Ragnarsson
Published 2012-12-01
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Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories by Sivaramakrishnan Ramesh, Arjun Ajaykumar, Lars-Åke Ragnarsson, Laurent Breuil, Gabriel Khalil El Hajjam, Ben Kaczer, Attilio Belmonte, Laura Nyns, Jean-Philippe Soulié, Geert Van den bosch, Maarten Rosmeulen
Published 2021-09-01
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