Modeling and simulation in atom probe tomography by Larson, D, Moody, M

On the flow of polythermal glaciers II: Surface wave analysis. by Fowler, A, Larson, D

Alloying elements partitioning in TiAl-Ru intermetallic alloys by Kim, S, Larson, D, Smith, G

Grain boundary segregation in boron added interstitial free steels studied by 3-dimensional atom probe by Seto, K, Larson, D, Larson, D, Warren, P, Warren, P, Smith, G, Smith, G

Sharpening of field-ion specimens and positioning of features of interest by ion-beam milling by Larson, D, Russell, K, Cerezo, A

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe by Cerezo, A, Larson, D, Smith, G

Improvement of multilayer analyses with a three-dimensional atom probe by Vurpillot, F, Larson, D, Cerezo, A

Microstructural investigation of Cu/Co multilayer films by Larson, D, Petford-Long, A, Cerezo, A

Tardive Dyskinesia in Older Persons Taking Antipsychotics by Citrome L, Isaacson SH, Larson D, Kremens D

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Modeling image distortions in 3DAP. by Vurpillot, F, Cerezo, A, Blavette, D, Larson, D

Experimental studies of the phase separation mechanism in Ti-15at%A1 by Liew, H, Smith, G, Cerezo, A, Larson, D

Introduction: Special issue on atom probe tomography by Ringer, S, Larson, D, Moody, M, Miller, M, Kelly, T

Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis by Larson, D, Petford-Long, A, Ma, Y, Cerezo, A

Three-dimensional atom probe studies of metallic multilayers by Larson, D, Petford-Long, A, Cerezo, A, Smith, G

Probing the improbable: imaging C atoms in alumina by Marquis, E, Yahya, N, Larson, D, Miller, M, Todd, R

Probing the improbable: imaging C atoms in alumina by Marquis, E, Yahya, N, Larson, D, Miller, M, Todd, R

Atom-Probe Tomographic Studies of Thin Films and Multilayers by Larson, D, Cerezo, A, Juraszek, J, Hono, K, Schmitz, G

The formation mechanism of aluminium oxide tunnel barriers by Cerezo, A, Petford-Long, A, Larson, D, Pinitsoontorn, S, Singleton, E

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures by Larson, D, Foord, D, Petford-Long, A, Cerezo, A, Smith, G

The development of information storage materials - How microscopy can help? by Petford-Long, A, Portier, X, Shang, P, Cerezo, A, Larson, D