Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy by Naresh-Kumar, G, Edwards, PR, Batten, T, Nouf-Allehiani, M, Vilalta-Clemente, A, Wilkinson, AJ, Le Boulbar, E, Shields, PA, Starosta, B, Hourahine, B, Martin, RW, Trager-Cowan, C