Nanoindentation response of semiconductors by LeBourhis, E., Patriarche, G.

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Surface engineering of titanium by multi-interstitial diffusion using plasma processing by Drouet M., Pichon L., Dubois J.B., Le Bourhis E., Christiansen T. L.

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Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for do evaluation by Baimpas, N, Le Bourhis, E, Eve, S, Thiaudière, D, Hardie, C, Korsunsky, A

Structure-mechanical function relations at nano-scale in heat-affected human dental tissue. by Sui, T, Sandholzer, M, Le Bourhis, E, Baimpas, N, Landini, G, Korsunsky, A

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d(o) evaluation by Baimpas, N, Le Bourhis, E, Eve, S, Thiaudiere, D, Hardie, C, Korsunsky, A

Structure-mechanical function relations at nano-scale in heat-affected human dental tissue. by Sui, T, Sandholzer, M, Le Bourhis, E, Baimpas, N, Landini, G, Korsunsky, A

Nano-scale residual stress depth profiling in Cu/W nano-multilayers as a function of magnetron sputtering pressure by Romano-Brandt, L, Salvati, E, Le Bourhis, E, Moxham, T, Dolbnya, I, Korsunsky, A

Stress-assisted thermal diffusion barrier breakdown in ion beam deposited Cu/W nano-multilayers on Si substrate observed by in Situ GISAXS and transmission EDX by Romano Brandt, L, Salvati, E, Wermeille, D, Papadaki, C, Le Bourhis, E, Korsunsky, AM

Mechanical characterization of nanostructured thin films at different scales by Chiron R., Randriamazaoro R.N., Goudeau P., Le Bourhis E., Renault P.O., Geandier G., Thiaudière D., Djaziri S., Castelnau O., Faurie D., Hild F.

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