Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions by Zhang, Z, Lobato, I, De Backer, A, Van Aert, S, Nellist, P

Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities. by De Backer, A, Jones, L, Lobato, I, Altantzis, T, Goris, B, Nellist, P, Bals, S, Van Aert, S

Single atom detection from low contrast-to-noise ratio electron microscopy images by Fatermans, J, Den Dekker, A, Müller-Caspary, K, Lobato, I, O'Leary, C, Nellist, P, Van Aert, S