Showing 1 - 2 results of 2 for search 'Lockwood, H', query time: 0.03s Refine Results
  1. 1
    Variability in long-duration operation of silicon tip field emission devices

    Variability in long-duration operation of silicon tip field emission devices by Aplin, K, Kent, B, Wang, L, Lockwood, H, Rouse, J, Stevens, R

    Published 2006
    Journal article
  2. 2
    Sources of variability in long-term testing of silicon tip field emission

    Sources of variability in long-term testing of silicon tip field emission by Aplin, K, Kent, B, Lockwood, H, Rouse, J, Stevens, R, Wang, L

    Published 2005
    Conference item

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