Mostrando 1 - 20 Resultados de 34 Para Buscar 'Long, N', tiempo de consulta: 0.03s
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Radiopharmaceuticals for imaging and therapy. por Faulkner, S, Long, N
Publicado 2011Journal article -
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Automated rapid thermal imaging systems technology por Phan, Long N., 1976-
Publicado 2012
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Collision avoidance via laser rangefinding por Phan, Long N., 1976-
Publicado 2013
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Novel imaging chelates for drug discovery por Stasiuk, G, Faulkner, S, Long, N
Publicado 2012Journal article -
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Novel imaging chelates for drug discovery. por Stasiuk, G, Faulkner, S, Long, N
Publicado 2012Journal article -
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ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING por Czernuszka, J, Long, N, Hirsch, P
Publicado 1991Conference item -
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ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING por Czernuszka, J, Long, N, Hirsch, P
Publicado 1991Journal article -
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HIGH-RESOLUTION MICROCHEMISTRY AND STRUCTURE OF GRAIN-BOUNDARIES IN BULK Y1BA2CU3O7-X por Romano, L, Wilshaw, P, Long, N, Grovenor, C
Publicado 1989Journal article -
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THE CHEMISTRY AND PROPERTIES OF GRAIN-BOUNDARIES IN CHEMICALLY THINNED Y1BA2CU3O7-X por Romano, L, Wilshaw, P, Long, N, Grovenor, C
Publicado 1989Journal article -
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Effects of surface relaxation on electron channelling contrast images of misfit dislocations por Wilkinson, A, Hirsch, P, Czernuszka, J, Long, N
Publicado 1994Conference item -
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ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS por Czernuszka, J, Long, N, Boyes, E, Hirsch, P
Publicado 1991Conference item -
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IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE por Czernuszka, J, Long, N, Boyes, E, Hirsch, P
Publicado 1990Journal article -
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ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS por Wilkinson, A, Hirsch, P, Czernuszka, J, Long, N
Publicado 1993Conference item -
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Effect of mechanical loadings on two unequal slanted cracks length in bi-materials plate por Hamzah, K. B., Nik Long, N. M. A.
Publicado 2022Artículo -
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ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON por Wilkinson, A, Anstis, G, Czernuszka, J, Long, N, Hirsch, P
Publicado 1993Journal article -
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POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS por Liddle, J, Long, N, Norman, A, Cerezo, A, Grovenor, C
Publicado 1989Conference item -
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