Erakusten 1 - 20 emaitzak -- 34 bilaketa honetara 'Long, N', Bilaketaren denbora: 0,03s
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1
Radiopharmaceuticals for imaging and therapy. nork Faulkner, S, Long, N
Argitaratua 2011Journal article -
2
Automated rapid thermal imaging systems technology nork Phan, Long N., 1976-
Argitaratua 2012
Thesis -
3
Collision avoidance via laser rangefinding nork Phan, Long N., 1976-
Argitaratua 2013
Thesis -
4
Novel imaging chelates for drug discovery nork Stasiuk, G, Faulkner, S, Long, N
Argitaratua 2012Journal article -
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Novel imaging chelates for drug discovery. nork Stasiuk, G, Faulkner, S, Long, N
Argitaratua 2012Journal article -
6
ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING nork Czernuszka, J, Long, N, Hirsch, P
Argitaratua 1991Conference item -
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ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING nork Czernuszka, J, Long, N, Hirsch, P
Argitaratua 1991Journal article -
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HIGH-RESOLUTION MICROCHEMISTRY AND STRUCTURE OF GRAIN-BOUNDARIES IN BULK Y1BA2CU3O7-X nork Romano, L, Wilshaw, P, Long, N, Grovenor, C
Argitaratua 1989Journal article -
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THE CHEMISTRY AND PROPERTIES OF GRAIN-BOUNDARIES IN CHEMICALLY THINNED Y1BA2CU3O7-X nork Romano, L, Wilshaw, P, Long, N, Grovenor, C
Argitaratua 1989Journal article -
10
Effects of surface relaxation on electron channelling contrast images of misfit dislocations nork Wilkinson, A, Hirsch, P, Czernuszka, J, Long, N
Argitaratua 1994Conference item -
11
ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS nork Czernuszka, J, Long, N, Boyes, E, Hirsch, P
Argitaratua 1991Conference item -
12
IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE nork Czernuszka, J, Long, N, Boyes, E, Hirsch, P
Argitaratua 1990Journal article -
13
ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS nork Wilkinson, A, Hirsch, P, Czernuszka, J, Long, N
Argitaratua 1993Conference item -
14
Effect of mechanical loadings on two unequal slanted cracks length in bi-materials plate nork Hamzah, K. B., Nik Long, N. M. A.
Argitaratua 2022Artikulua -
15
ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON nork Wilkinson, A, Anstis, G, Czernuszka, J, Long, N, Hirsch, P
Argitaratua 1993Journal article -
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POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS nork Liddle, J, Long, N, Norman, A, Cerezo, A, Grovenor, C
Argitaratua 1989Conference item -
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